Optical and Morphological Properties of Cu2FeSnS4 Chalcogenide Films

P-type Cu2FeSnS4 (CFTS) and Cu2ZnSnS4 (CZTS) quaternary chalcogenide films have been grown by the method of spin coating on glass substrates relate to 30 40 sccm sulfur flux. Physical properties obtained samples were investigated X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force (AFM) ultraviolet visible spectroscopy (UV-Vis) see effect deposition parameters thin film. The crystal including size, dislocation density strain value changed related parameters. XRD results indicated an improvement crystalline quality CFTS with a maximum size about 50 nm for (112) peak orientation. SEM images illustrated that particle was increase in flux sulfur, which confirmed both AFM images. It seen absorption energy band gap CZTS film exhibited more strong all UV-Vis region. values calculated 1.51, 1.53, 1.82 1.91 eV (30 sccm), (40 sccm) annealed H2S gas, respectively.